QSM – Quantum Scanning Microscope

We are proud to present the QSM, the first turnkey instrument which uses scanning NV technology. The QSM is a next-generation scanning probe microscope based on quantum metrology. Our QSM provides new capabilities and unmatched performance in the quantitative magnetic analysis of nanoscale surfaces and device elements (see Applications).

At a glance

  • Turn-key instrument
  • Magnetic field resolution better than 50 nm and 10 uT (vector)
  • Low drift scanning stage and compact optics head
  • Simple tip exchange
  • Equipped with QS3 quantum controller
  • Powerful options available

Key specifications

Key specifications include (contact us for further detail):

Scan range90x90x15 um, 0.2 nm resolution, 6 mm coarse range, closed loop
Magnetic spatial resolution30-70 nm (read how it works)
Magnetic sensitivity1-10 uT/Hz^{1/2} (depends on probe tip; read how it works)

Download the instrument flyer here!

How to order

Contact us for further information or a quotation.

The following features are included in all QSM systems:

  • Scanning force microscope and controller, closed-loop control
  • Optics head including excitation and detection channels and CCD alignment camera
  • Sample platform
  • Sensor holder with force-feedback and microwave connectivity
  • Quantum control console including optical and microwave excitation and detection
  • QS3 quantum control software package
  • Intuitive user interface

You can customize the system with additional options:

  • Time-domain option providing powerful pulsed quantum control and AC detection capabilities
  • Electromagnet option providing switchable vector fields up to 80 mT

Technology

The QSM integrates all the capabilities of an NV scanning probe in a turnkey instrument. It sets a new standard for users who do not want to go through the time-consuming process of developing or adapting their own instrument. The QSM is delivered ready to measure and, with an intuitive user interface, it enables a quick start into the world of magnetic and current imaging.

To ensure the most crucial attribute, low drift, we have partnered with a specialist for AFM measurements. By using a proven platform, we can guarantee minimal distortion even for scans lasting tens of hours.

We combined all of the required optics into a robust and compact package which requires minimal maintenance while providing the performance necessary for high quality scans. The optics can move away to grant easy access to the tip and the sample for exchange.

Tips exchange is now easier than ever! The process is user friendly, significantly reduces the chance of breaking the tip and the microwave antenna is pre aligned.